SEM Imaging Services

Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM) is a powerful imaging technique that produces high-resolution images of a sample’s surface. It employs a focused beam of electrons to scan the specimen, generating signals that reveal intricate details about its topography and composition. SEM excels in providing high-resolution images, depth perception, and elemental analysis (EDS). SEM is applicable across various fields, including materials science (especially nanomaterials), biology, and geology.

Applications:

Materials Characterization: Analyze microstructure, particle size, and surface morphology.
Failure Analysis: Identify the root cause of material failures with precision.
Quality Control: Ensure product consistency and adherence to specifications.
Research and Development: Advance your materials science and engineering projects.

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In-house SEM Services

NEI Corporation is proud to expand its analytical services to include in-house Scanning Electron Microscopy (SEM). Our cutting-edge SEM capabilities provide unparalleled microscopic imaging and analysis for a wide range of materials and applications.

Powders

Surface of Lithium-ion anode powder particle
(shown at 10,000x magnification)

Electrode Surface

Top surface of a Li-ion battery electrode sheet
(shown at 5,000x magnification)

Coating Cross-Section

Cross-section of a protective surface coating
(shown at 10,000x magnification)

Why Choose NEI for Your SEM Needs?

NEI Corporation’s commitment to excellence extends to our SEM services. Our advanced equipment and expert team deliver reliable, accurate, and timely results. SEM imaging can be provided as a standalone service, or it can be integrated with other characterization or R&D services that we offer.

High-Resolution Imaging: Our advanced SEM systems deliver exceptional image quality, revealing intricate details at the nanoscale.
Elemental Analysis: Determine the elemental composition of a sample using Energy Dispersive X-ray Spectroscopy (EDS)
Versatile Analysis: Explore a wide range of materials, from metals and polymers to ceramics and composites.
Expert Interpretation: Our experienced scientists can provide in-depth analysis and interpretation of SEM data.
Tailored Solutions: Benefit from our customized SEM services to address your specific research or quality control requirements.

Select a tab below to learn more about our available SEM services or Request a Quote.

High-Resolution Imaging

See Your Materials Like Never Before

Cross-section of a cast electrode sheet shown at 2,000 and 10,000 magnification

High-resolution imaging through Scanning Electron Microscopy (SEM) gives you the ability to visualize the incredibly fine details of a sample’s surface topography. Our SEM equipment has both a Backscattered Electron Detector (BSD) and a Secondary Electron Detector (SED), which can be configured to readily identify different phases present in a sample and provide crisp and high-resolution surface-sensitive imaging. This level of detail allows for:

Observation of nanoscale features: Revealing structures, defects, and particles that are invisible to traditional microscopes.
Precise measurements: Determining the size, shape, and distribution of nanoscale components with high accuracy.
Detailed surface characterization: Understanding the surface roughness, texture, and topography of materials.

Materials Science Applications include:

Battery: High-resolution imaging of battery materials offers invaluable insights for optimizing performance, longevity, and safety. By visualizing the material’s microstructure, researchers and engineers can understand degradation mechanisms, optimize material design, improve quality control, and even accelerate battery development.
Coatings: SEM offers a wealth of information crucial for the coatings industry. By visualizing the coating’s microstructure at the nanoscale, manufacturers can accelerate coating development by analyzing failure modes to improve quality control and optimize coating performance.

Available Magnifications:

Our SEM can obtain images up to 100,000 times magnification and resolution smaller than 10 nm.

SEM Elemental Analysis

Unveiling the Composition of Matter

SEM elemental analysis is a powerful technique that combines Scanning Electron Microscopy (SEM) with Energy Dispersive X-ray Spectroscopy (EDS) to determine the elemental composition of a sample. This method offers valuable insights into the distribution and concentration of elements within a material.

How it works:

SEM Imaging: The SEM generates high-resolution images of the sample’s surface, allowing for the identification of specific areas of interest for elemental analysis.
EDS Analysis: The EDS detector captures the characteristic X-rays emitted by the sample when bombarded with the electron beam. These X-rays correspond to the elements present in the sample.
Data Interpretation: The EDS spectrum provides information about the elements present, their relative concentrations, and their spatial distribution within the analyzed area.

Click on the next tab to see examples of EDS images and analysis.

Benefits of SEM Elemental Analysis:

High spatial resolution: Allows for the analysis of small features and inclusions.
Non-destructive: Does not damage the sample, enabling further analysis.
Rapid analysis: Provides quick elemental information without extensive sample preparation.
Versatility: Applicable to a wide range of materials, including metals, ceramics, polymers, and composites.

By combining imaging and elemental analysis, SEM-EDS is an invaluable tool for researchers, engineers, and scientists across various industries.

EDS Image Samples

Process Overview

SEM Process Overview

Let us know how many samples you’ll be submitting and the number of images and magnfications required for each sample. You can also request add-on services, such as elemental analysis and mapping.

1. Sample Requirements

Materials – a variety of sample forms can be examined, ranging from powders, cast electrodes (both the surface and the cross-section), coatings (surface and cross-section), electrospun fibers, and composite materials.
Sample Format – all samples must be dry (NEI can dry & prepare liquid samples or dispersions for an additional fee)
Sample Size – the SEM can accommodate samples up to 1 inch (25 mm) in diameter (samples larger than this will need to be cut down)
SDS – a safety data sheet will be required for each material you send us

2. Request a Quote

Use our quote form in the next tab to request pricing.
If you have questions or a specific request, we are happy to schedule a brief call with you to understand your imaging needs.
NDA – you can email us your NDA or view & download ours (pdf)

3. Submit Your Order

NEI accepts company & university purchase orders or you may ask us for an order form.
Accepted Forms of Payment: bank check or ACH/EFT (US & Canada only), international wire transfers, or credit cards

4. Ship your Sample(s)

Once your order is received, send us your samples and an SDS for each material (if applicable).
Ship to Address: 400 Apgar Drive, Unit E ♦ Somerset, NJ 08873 USA
Conference Call – we can schedule a brief call with you to understand your imaging needs

5. Imaging & Analysis

For each sample, you can specify how many images you need at various magnifications (up to 100,000x).
NEI will process your sample(s) within 5 to 7 business days of receiving your order and samples.

6. Optional Add-on Services (*additional fees will apply)

Sample Preparation – required if your samples need to be specially prepared, dried, or cut down to size (≤ 1″ diameter)
EDS Elemental Analysis – obtain elemental composition data from various spots of your sample (via EDS)
EDS Elemental Mapping – obtain elemental composition data throughout the distribution of the whole sample (via EDS)
Summary Report – a detailed report with a summary analysis of each sample can be supplied (upon request only)
Rush Service – samples can be expedited and processed within 1 to 2 business days (subject to availability)
Return Shipping – samples can be returned upon request (shipping charges will apply)

7. Deliverables

High Resolution Images – raw image files (.tiff) will be supplied electronically
Optional Elemental Analysis – a software generated report (.pdf) with the elemental composition of each sample will be supplied
Optional Summary Report – a detailed report or presentation (.pdf) with our summary analysis will be supplied

Get a Quote

Let’s Get Started

Submit a request using our quote form below and an NEI representative will get back to you with pricing.

Let us know what types of samples you’ll be submitting and the quantity
Optional: you can also request the add-on service of elemental analysis and mapping
Need an NDA? No problem! Your intellectual property rights are fully protected at all times (view & download our NDA).

Quote Form

Complete the form below to request a quote (*required field).

Title

*First Name

*Last Name

*Company / Organization

*Email Address

*Phone Number

*Total Number of Samples

*Sample / Material Description

*Known Material Hazards (select one or more)
Hygroscopic/Air SensitiveElectrically ConductiveOther Hazards (explain below)Not Hazardous

*SEM Service Options (hold CTRL for multiple selections)

Optional Add-on Services - Additional fees apply (hold CTRL for multiple selections)

*Do you require an NDA?
YesNo

Additional Comments

SEM Imaging Services

Scanning Electron Microscopy (SEM)

Applications:

In-house SEM Services

Powders

Electrode Surface

Coating Cross-Section

Why Choose NEI for Your SEM Needs?

See Your Materials Like Never Before

Unveiling the Composition of Matter

Elemental Analysis Example

Elemental Mapping Example

SEM Process Overview

Let’s Get Started

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